Inproceedings,
Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges .
J. Saxena, K. Butler, J. Gatt, R. Raghuraman, S. Kumar, S. Basu, D. Campbell, and J. Berech.ITC, page 1120-1129. IEEE Computer Society, (2002)
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- inproceedings
- booktitle
- ITC
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- 2002
- pages
- 1120-1129
- publisher
- IEEE Computer Society
- crossref
- conf/itc/2002
- ee
- https://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041869
- isbn
- 0-7803-7543-2
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- http://dblp.uni-trier.de/db/conf/itc/itc2002.html#SaxenaBGRKBCB02
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%1 conf/itc/SaxenaBGRKBCB02
%A Saxena, Jayashree
%A Butler, Kenneth M.
%A Gatt, John
%A Raghuraman, R.
%A Kumar, Sudheendra Phani
%A Basu, Supatra
%A Campbell, David J.
%A Berech, John
%B ITC
%D 2002
%I IEEE Computer Society
%K dblp
%P 1120-1129
%T Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges .
%U http://dblp.uni-trier.de/db/conf/itc/itc2002.html#SaxenaBGRKBCB02
%@ 0-7803-7543-2
@inproceedings{conf/itc/SaxenaBGRKBCB02,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Saxena, Jayashree and Butler, Kenneth M. and Gatt, John and Raghuraman, R. and Kumar, Sudheendra Phani and Basu, Supatra and Campbell, David J. and Berech, John},
biburl = {https://www.bibsonomy.org/bibtex/29555348d497d2d829d1562428c175072/dblp},
booktitle = {ITC},
crossref = {conf/itc/2002},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041869},
interhash = {6973a823f9b29cf13aa6880d23f0682b},
intrahash = {9555348d497d2d829d1562428c175072},
isbn = {0-7803-7543-2},
keywords = {dblp},
pages = {1120-1129},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:28:16.000+0200},
title = {Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges .},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2002.html#SaxenaBGRKBCB02},
year = 2002
}