%0 Journal Article %1 journals/mr/WhitmanM05 %A Whitman, Charles S. %A Meeder, Michael %D 2005 %J Microelectron. Reliab. %K dblp %N 12 %P 1882-1893 %T Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#WhitmanM05 %V 45

@article{journals/mr/WhitmanM05, added-at = {2020-02-22T00:00:00.000+0100}, author = {Whitman, Charles S. and Meeder, Michael}, biburl = {https://www.bibsonomy.org/bibtex/21a4d7dc49b2406ab3b9cbfc16b4b90be/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.01.016}, interhash = {6c138c0cb54e285aea0b915c9182c4fe}, intrahash = {1a4d7dc49b2406ab3b9cbfc16b4b90be}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {1882-1893}, timestamp = {2020-02-25T13:29:24.000+0100}, title = {Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#WhitmanM05}, volume = 45, year = 2005 }