Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/mr/HastasADBTK11
%A Hastas, N. A.
%A Arpatzanis, N.
%A Dimitriadis, C. A.
%A Brochet, Julien
%A Templier, François
%A Kamarinos, G.
%D 2011
%J Microelectron. Reliab.
%K dblp
%N 3
%P 556-559
%T Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors.
%U http://dblp.uni-trier.de/db/journals/mr/mr51.html#HastasADBTK11
%V 51
@article{journals/mr/HastasADBTK11,
added-at = {2020-03-18T00:00:00.000+0100},
author = {Hastas, N. A. and Arpatzanis, N. and Dimitriadis, C. A. and Brochet, Julien and Templier, François and Kamarinos, G.},
biburl = {https://www.bibsonomy.org/bibtex/2295cf89a60995346b49fee9aa8aec089/dblp},
ee = {https://doi.org/10.1016/j.microrel.2010.09.035},
interhash = {6d6d9d20399b095cd92f584cb97ee0dc},
intrahash = {295cf89a60995346b49fee9aa8aec089},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 3,
pages = {556-559},
timestamp = {2020-03-19T11:37:51.000+0100},
title = {Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#HastasADBTK11},
volume = 51,
year = 2011
}