%0 Journal Article %1 journals/mr/WangWHSHG18 %A Wang, Tun %A Wang, Baoming %A Haque, Aman %A Snure, Michael %A Heller, Eric %A Glavin, Nicholas %D 2018 %J Microelectron. Reliab. %K dblp %P 181-185 %T Mechanical stress effects on electrical breakdown of freestanding GaN thin films. %U http://dblp.uni-trier.de/db/journals/mr/mr81.html#WangWHSHG18 %V 81

@article{journals/mr/WangWHSHG18, added-at = {2023-09-30T00:00:00.000+0200}, author = {Wang, Tun and Wang, Baoming and Haque, Aman and Snure, Michael and Heller, Eric and Glavin, Nicholas}, biburl = {https://www.bibsonomy.org/bibtex/2337e37683ac0b58288fde436303f081a/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.12.033}, interhash = {6f86f4b405a4579a50991d9b578fa198}, intrahash = {337e37683ac0b58288fde436303f081a}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {181-185}, timestamp = {2024-04-09T02:49:28.000+0200}, title = {Mechanical stress effects on electrical breakdown of freestanding GaN thin films.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr81.html#WangWHSHG18}, volume = 81, year = 2018 }