%0 Conference Paper %1 conf/irps/SchwabeLWSB23 %A Schwabe, Christian %A Liu, Xing %A Wassermann, Tobias N. %A Salmen, Paul %A Basler, Thomas %B IRPS %D 2023 %I IEEE %K dblp %P 1-6 %T SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SchwabeLWSB23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/SchwabeLWSB23, added-at = {2023-09-30T00:00:00.000+0200}, author = {Schwabe, Christian and Liu, Xing and Wassermann, Tobias N. and Salmen, Paul and Basler, Thomas}, biburl = {https://www.bibsonomy.org/bibtex/2e0049754bea5ae1dac1443625e577dd0/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10118274}, interhash = {7092c7ad77aeb92e83e7a312f65bbbbe}, intrahash = {e0049754bea5ae1dac1443625e577dd0}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SchwabeLWSB23}, year = 2023 }