%0 Conference Paper %1 conf/itc/YonedaUF03 %A Yoneda, Tomokazu %A Uchiyama, Tetsuo %A Fujiwara, Hideo %B ITC %D 2003 %I IEEE Computer Society %K dblp %P 415-422 %T Area and Time Co-Optimization for System-on-a-Chip based on Consecutive Testability. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#YonedaUF03 %@ 0-7803-8106-8

@inproceedings{conf/itc/YonedaUF03, added-at = {2023-03-23T00:00:00.000+0100}, author = {Yoneda, Tomokazu and Uchiyama, Tetsuo and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2145fd28644fef7cc6e0fe5f875ea5877/dblp}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270866}, interhash = {71b1f4ae832326e4e0dc45449ccc8c85}, intrahash = {145fd28644fef7cc6e0fe5f875ea5877}, isbn = {0-7803-8106-8}, keywords = {dblp}, pages = {415-422}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:31.000+0200}, title = {Area and Time Co-Optimization for System-on-a-Chip based on Consecutive Testability.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#YonedaUF03}, year = 2003 }