%0 Conference Paper %1 conf/esem/KameiMMKM07 %A Kamei, Yasutaka %A Monden, Akito %A Matsumoto, Shinsuke %A Kakimoto, Takeshi %A ichi Matsumoto, Ken %B ESEM %D 2007 %I ACM / IEEE Computer Society %K dblp %P 196-204 %T The Effects of Over and Under Sampling on Fault-prone Module Detection. %U http://dblp.uni-trier.de/db/conf/esem/esem2007.html#KameiMMKM07 %@ 0-7695-2886-4

@inproceedings{conf/esem/KameiMMKM07, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kamei, Yasutaka and Monden, Akito and Matsumoto, Shinsuke and Kakimoto, Takeshi and ichi Matsumoto, Ken}, biburl = {https://www.bibsonomy.org/bibtex/22d77cfcb26b07a6635f134aa432119ad/dblp}, booktitle = {ESEM}, crossref = {conf/esem/2007}, ee = {https://doi.ieeecomputersociety.org/10.1109/ESEM.2007.28}, interhash = {71cef1f32fd9959acccfeb1c210872ea}, intrahash = {2d77cfcb26b07a6635f134aa432119ad}, isbn = {0-7695-2886-4}, keywords = {dblp}, pages = {196-204}, publisher = {ACM / IEEE Computer Society}, timestamp = {2024-04-10T14:55:03.000+0200}, title = {The Effects of Over and Under Sampling on Fault-prone Module Detection.}, url = {http://dblp.uni-trier.de/db/conf/esem/esem2007.html#KameiMMKM07}, year = 2007 }