%0 Conference Paper %1 conf/dft/ManuzzatoRGPSV07 %A Manuzzato, Andrea %A Rech, Paolo %A Gerardin, Simone %A Paccagnella, Alessandro %A Sterpone, Luca %A Violante, Massimo %B DFT %D 2007 %E Bolchini, Cristiana %E Kim, Yong-Bin %E Salsano, Adelio %E Touba, Nur A. %I IEEE Computer Society %K dblp %P 79-86 %T Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. %U http://dblp.uni-trier.de/db/conf/dft/dft2007.html#ManuzzatoRGPSV07 %@ 0-7695-2885-6

@inproceedings{conf/dft/ManuzzatoRGPSV07, added-at = {2023-03-24T00:00:00.000+0100}, author = {Manuzzato, Andrea and Rech, Paolo and Gerardin, Simone and Paccagnella, Alessandro and Sterpone, Luca and Violante, Massimo}, biburl = {https://www.bibsonomy.org/bibtex/2e4f49865277665332a80e720c974a05d/dblp}, booktitle = {DFT}, crossref = {conf/dft/2007}, editor = {Bolchini, Cristiana and Kim, Yong-Bin and Salsano, Adelio and Touba, Nur A.}, ee = {https://www.wikidata.org/entity/Q57699197}, interhash = {71e3e213f84df1f662d1e2d1ba435243}, intrahash = {e4f49865277665332a80e720c974a05d}, isbn = {0-7695-2885-6}, keywords = {dblp}, pages = {79-86}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:56:50.000+0200}, title = {Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2007.html#ManuzzatoRGPSV07}, year = 2007 }