%0 Conference Paper %1 conf/vts/OberleMM91 %A Oberle, H.-D. %A Maue, M. %A Muhmenthaler, Peter %B VTS %D 1991 %I IEEE Computer Society %K dblp %P 149-154 %T Enhanced fault modeling for DRAM test and analysis. %U http://dblp.uni-trier.de/db/conf/vts/vts1991.html#OberleMM91

@inproceedings{conf/vts/OberleMM91, added-at = {2023-03-24T00:00:00.000+0100}, author = {Oberle, H.-D. and Maue, M. and Muhmenthaler, Peter}, biburl = {https://www.bibsonomy.org/bibtex/23370693ff7b5f11187529dac303e7e24/dblp}, booktitle = {VTS}, crossref = {conf/vts/1991}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1991.208150}, interhash = {71f910b7bad222a07ee1caf6a7effa6d}, intrahash = {3370693ff7b5f11187529dac303e7e24}, keywords = {dblp}, pages = {149-154}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:10.000+0200}, title = {Enhanced fault modeling for DRAM test and analysis.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1991.html#OberleMM91}, year = 1991 }