%0 Conference Paper %1 conf/itc/MaugardWOK03 %A Maugard, Gwenolé %A Wegener, Carsten %A O'Dwyer, Tom %A Kennedy, Michael Peter %B ITC %D 2003 %I IEEE Computer Society %K dblp %P 210-217 %T Method of reducing contactor effect when testing high-precision ADCs. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#MaugardWOK03 %@ 0-7803-8106-8

@inproceedings{conf/itc/MaugardWOK03, added-at = {2023-03-23T00:00:00.000+0100}, author = {Maugard, Gwenolé and Wegener, Carsten and O'Dwyer, Tom and Kennedy, Michael Peter}, biburl = {https://www.bibsonomy.org/bibtex/2989132aaa19a5d6581cd2b0487b2b1a7/dblp}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270842}, interhash = {76c2cf7339f4386131210c881b266028}, intrahash = {989132aaa19a5d6581cd2b0487b2b1a7}, isbn = {0-7803-8106-8}, keywords = {dblp}, pages = {210-217}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:31.000+0200}, title = {Method of reducing contactor effect when testing high-precision ADCs.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#MaugardWOK03}, year = 2003 }