%0 Conference Paper %1 conf/case/ClainBJR21 %A Clain, Rebecca %A Borodin, Valeria %A Juge, Michel %A Roussy, Agnès %B CASE %D 2021 %I IEEE %K dblp %P 1621-1626 %T Virtual metrology for semiconductor manufacturing: Focus on transfer learning. %U http://dblp.uni-trier.de/db/conf/case/case2021.html#ClainBJR21 %@ 978-1-6654-1873-7

@inproceedings{conf/case/ClainBJR21, added-at = {2024-02-05T00:00:00.000+0100}, author = {Clain, Rebecca and Borodin, Valeria and Juge, Michel and Roussy, Agnès}, biburl = {https://www.bibsonomy.org/bibtex/2712b6d287127442a28f77ce67ed813f1/dblp}, booktitle = {CASE}, crossref = {conf/case/2021}, ee = {https://doi.org/10.1109/CASE49439.2021.9551567}, interhash = {78046ae425dc5b42a5a2dfe6231de95f}, intrahash = {712b6d287127442a28f77ce67ed813f1}, isbn = {978-1-6654-1873-7}, keywords = {dblp}, pages = {1621-1626}, publisher = {IEEE}, timestamp = {2024-04-09T17:50:02.000+0200}, title = {Virtual metrology for semiconductor manufacturing: Focus on transfer learning.}, url = {http://dblp.uni-trier.de/db/conf/case/case2021.html#ClainBJR21}, year = 2021 }