Inproceedings,
Study of MOSFET thermal stability with TSV in operation temperature using novel 3D-LSI stress analysis.
H. Kitada, H. Tashiro, S. Miyahara, T. Ishitsuka, A. Dote, S. Tadaki, T. Nakada, and S. Sakuyama.3DIC, page 1-4. IEEE, (2016)
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- conf/3dic/KitadaTMIDTNS16
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- inproceedings
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- 3DIC
- year
- 2016
- pages
- 1-4
- publisher
- IEEE
- crossref
- conf/3dic/2016
- ee
- https://doi.org/10.1109/3DIC.2016.7969997
- isbn
- 978-1-5090-1399-9
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- http://dblp.uni-trier.de/db/conf/3dic/3dic2016.html#KitadaTMIDTNS16
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- please select -%0 Conference Paper
%1 conf/3dic/KitadaTMIDTNS16
%A Kitada, Hideki
%A Tashiro, Hiroko
%A Miyahara, Shoichi
%A Ishitsuka, Takeshi
%A Dote, Aki
%A Tadaki, Shinji
%A Nakada, Tatsumi
%A Sakuyama, Seiki
%B 3DIC
%D 2016
%I IEEE
%K dblp
%P 1-4
%T Study of MOSFET thermal stability with TSV in operation temperature using novel 3D-LSI stress analysis.
%U http://dblp.uni-trier.de/db/conf/3dic/3dic2016.html#KitadaTMIDTNS16
%@ 978-1-5090-1399-9
@inproceedings{conf/3dic/KitadaTMIDTNS16,
added-at = {2017-07-13T00:00:00.000+0200},
author = {Kitada, Hideki and Tashiro, Hiroko and Miyahara, Shoichi and Ishitsuka, Takeshi and Dote, Aki and Tadaki, Shinji and Nakada, Tatsumi and Sakuyama, Seiki},
biburl = {https://www.bibsonomy.org/bibtex/284d9e730d9e52ceb419041301cfed578/dblp},
booktitle = {3DIC},
crossref = {conf/3dic/2016},
ee = {https://doi.org/10.1109/3DIC.2016.7969997},
interhash = {7826d98ee10ae832f2f4e959cc2b8d38},
intrahash = {84d9e730d9e52ceb419041301cfed578},
isbn = {978-1-5090-1399-9},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2019-10-17T15:31:46.000+0200},
title = {Study of MOSFET thermal stability with TSV in operation temperature using novel 3D-LSI stress analysis.},
url = {http://dblp.uni-trier.de/db/conf/3dic/3dic2016.html#KitadaTMIDTNS16},
year = 2016
}