%0 Journal Article %1 journals/mr/JablonskiLBVVDV15 %A Jablonski, Michal %A Lucchini, Riccardo %A Bossuyt, Frederick %A Vervust, Thomas %A Vanfleteren, Jan %A DeVries, J. W. C. %A Vena, Pasquale %A Gonzalez, Mario %D 2015 %J Microelectron. Reliab. %K dblp %N 1 %P 143-154 %T Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#JablonskiLBVVDV15 %V 55

@article{journals/mr/JablonskiLBVVDV15, added-at = {2024-02-05T00:00:00.000+0100}, author = {Jablonski, Michal and Lucchini, Riccardo and Bossuyt, Frederick and Vervust, Thomas and Vanfleteren, Jan and DeVries, J. W. C. and Vena, Pasquale and Gonzalez, Mario}, biburl = {https://www.bibsonomy.org/bibtex/275da826ad1793ebbd87db8d42e9b54d2/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.09.009}, interhash = {7827196d0aef4c0cf4972cf667ef9d74}, intrahash = {75da826ad1793ebbd87db8d42e9b54d2}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {143-154}, timestamp = {2024-04-09T02:49:44.000+0200}, title = {Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#JablonskiLBVVDV15}, volume = 55, year = 2015 }