Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate.
Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/drc/IslamSSZBFSFBHS23
%A Islam, Sajal
%A Senarath, Aditha S.
%A Sengupta, Arijit
%A xia Zhang, En
%A Ball, Dennis R.
%A Fleetwood, Daniel M.
%A Schrimpf, Ronald D.
%A Farzana, Esmat
%A Bhattacharyya, Arkka
%A Hendricks, Nolan S.
%A Speck, James S.
%B DRC
%D 2023
%I IEEE
%K dblp
%P 1-2
%T Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate.
%U http://dblp.uni-trier.de/db/conf/drc/drc2023.html#IslamSSZBFSFBHS23
%@ 979-8-3503-2310-8
@inproceedings{conf/drc/IslamSSZBFSFBHS23,
added-at = {2023-09-30T00:00:00.000+0200},
author = {Islam, Sajal and Senarath, Aditha S. and Sengupta, Arijit and xia Zhang, En and Ball, Dennis R. and Fleetwood, Daniel M. and Schrimpf, Ronald D. and Farzana, Esmat and Bhattacharyya, Arkka and Hendricks, Nolan S. and Speck, James S.},
biburl = {https://www.bibsonomy.org/bibtex/2694451b669cfcf8ec9dde928f8c7b849/dblp},
booktitle = {DRC},
crossref = {conf/drc/2023},
ee = {https://doi.org/10.1109/DRC58590.2023.10187004},
interhash = {7d7642acf40ea6740195a1b78f0e8412},
intrahash = {694451b669cfcf8ec9dde928f8c7b849},
isbn = {979-8-3503-2310-8},
keywords = {dblp},
pages = {1-2},
publisher = {IEEE},
timestamp = {2024-04-09T23:47:17.000+0200},
title = {Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate.},
url = {http://dblp.uni-trier.de/db/conf/drc/drc2023.html#IslamSSZBFSFBHS23},
year = 2023
}