%0 Journal Article %1 journals/mr/Rey-TauriacTB01a %A Rey-Tauriac, Yannick %A Taurin, M. %A Bonnaud, Olivier %D 2001 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1707-1712 %T High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#Rey-TauriacTB01a %V 41

@article{journals/mr/Rey-TauriacTB01a, added-at = {2020-02-22T00:00:00.000+0100}, author = {Rey-Tauriac, Yannick and Taurin, M. and Bonnaud, Olivier}, biburl = {https://www.bibsonomy.org/bibtex/2e5f38e5cbdc4bcc25cda4b14b4ec86ee/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00204-9}, interhash = {7e228d176c92bc6402b9ced8d4eebc7b}, intrahash = {e5f38e5cbdc4bcc25cda4b14b4ec86ee}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1707-1712}, timestamp = {2020-02-25T13:23:02.000+0100}, title = {High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#Rey-TauriacTB01a}, volume = 41, year = 2001 }