Abstract
In this paper, we did a study of the effect of the presence of BIT
(Bi4Ti3O12) in the dielectric and optical properties of the CaCu3Ti4O12
(CCTO) thick films. The films were prepared by the solid sate procedure.
Mechanical alloying followed by the solid state procedure has been used
successfully to produce powders of CaCu3Ti4O12 (CCTO) and BIT
(Bi4Ti3O12) to be used in the composites. We also look at the effect of
the grain size of the BIT and CCTO in the final properties of the
composite film. The samples were studied using X-Ray diffraction,
scanning electron microscopy (SEM), Raman and infrared spectroscopy. We
also did a study of the dielectric funcion (K) and dielectric loss (D)
of the films. The role played by the grain size of CCTO and BIT in the
dielectric constant and structural properties of the films are
discussed. These measurements confirm the potential use of such
materials for small high dielectric planar devices. These films are also
attractive for capacitor applications and certainly for
microelectronics, microwave devices (mobile phones for example), where
the miniaturization of the devices is crucial.
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