%0 Journal Article %1 journals/ibmrd/FowlerFH64 %A Fowler, Alan B. %A Fang, Frank F. %A Hochberg, Frederick %D 1964 %J IBM J. Res. Dev. %K dblp %N 4 %P 427-429 %T Hall Measurements on Silicon Field Effect Transistor Structures. %U http://dblp.uni-trier.de/db/journals/ibmrd/ibmrd8.html#FowlerFH64 %V 8

@article{journals/ibmrd/FowlerFH64, added-at = {2020-03-13T00:00:00.000+0100}, author = {Fowler, Alan B. and Fang, Frank F. and Hochberg, Frederick}, biburl = {https://www.bibsonomy.org/bibtex/24a88d01f150fb6f8934d27826775f23e/dblp}, ee = {https://doi.org/10.1147/rd.84.0427}, interhash = {7f217368db7c9e3488df425e5eae4792}, intrahash = {4a88d01f150fb6f8934d27826775f23e}, journal = {IBM J. Res. Dev.}, keywords = {dblp}, number = 4, pages = {427-429}, timestamp = {2020-03-14T11:49:40.000+0100}, title = {Hall Measurements on Silicon Field Effect Transistor Structures.}, url = {http://dblp.uni-trier.de/db/journals/ibmrd/ibmrd8.html#FowlerFH64}, volume = 8, year = 1964 }