%0 Conference Paper %1 conf/vlsid/BaikS06 %A Baik, Dong Hyun %A Saluja, Kewal K. %B VLSI Design %D 2006 %I IEEE Computer Society %K dblp %P 169-174 %T Test Cost Reduction Using Partitioned Grid Random Access Scan. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2006.html#BaikS06 %@ 0-7695-2502-4

@inproceedings{conf/vlsid/BaikS06, added-at = {2023-03-24T00:00:00.000+0100}, author = {Baik, Dong Hyun and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/2865c0351e6bbd4521beb511955f1a125/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2006}, ee = {https://doi.ieeecomputersociety.org/10.1109/VLSID.2006.157}, interhash = {7f2964bf5cc32ce118c54f97f709577e}, intrahash = {865c0351e6bbd4521beb511955f1a125}, isbn = {0-7695-2502-4}, keywords = {dblp}, pages = {169-174}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:17:52.000+0200}, title = {Test Cost Reduction Using Partitioned Grid Random Access Scan.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2006.html#BaikS06}, year = 2006 }