%0 Conference Paper %1 conf/date/MurgaiRMHT04 %A Murgai, Rajeev %A Reddy, Subodh M. %A Miyoshi, Takashi %A Horie, Takeshi %A Tahoori, Mehdi Baradaran %B DATE %D 2004 %I IEEE Computer Society %K dblp %P 610-615 %T Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis. %U http://dblp.uni-trier.de/db/conf/date/date2004-1.html#MurgaiRMHT04 %@ 0-7695-2085-5

@inproceedings{conf/date/MurgaiRMHT04, added-at = {2023-03-24T00:00:00.000+0100}, author = {Murgai, Rajeev and Reddy, Subodh M. and Miyoshi, Takashi and Horie, Takeshi and Tahoori, Mehdi Baradaran}, biburl = {https://www.bibsonomy.org/bibtex/26fa6ab6e70230c3682ae6a0dc450b763/dblp}, booktitle = {DATE}, crossref = {conf/date/2004}, ee = {http://dl.acm.org/citation.cfm?id=969055}, interhash = {7fb0223dadd678b5cc0febff6a18a1d5}, intrahash = {6fa6ab6e70230c3682ae6a0dc450b763}, isbn = {0-7695-2085-5}, keywords = {dblp}, pages = {610-615}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:51:35.000+0200}, title = {Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis.}, url = {http://dblp.uni-trier.de/db/conf/date/date2004-1.html#MurgaiRMHT04}, year = 2004 }