%0 Journal Article %1 journals/mr/SundaramoorthyB14 %A Sundaramoorthy, Vinoth K. %A Bianda, E. %A Bloch, R. %A Angelosante, Daniele %A Nistor, Iulian %A Riedel, G. J. %A Zurfluh, F. %A Knapp, G. %A Heinemann, A. %D 2014 %J Microelectron. Reliab. %K dblp %N 11 %P 2423-2431 %T A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#SundaramoorthyB14 %V 54

@article{journals/mr/SundaramoorthyB14, added-at = {2020-02-22T00:00:00.000+0100}, author = {Sundaramoorthy, Vinoth K. and Bianda, E. and Bloch, R. and Angelosante, Daniele and Nistor, Iulian and Riedel, G. J. and Zurfluh, F. and Knapp, G. and Heinemann, A.}, biburl = {https://www.bibsonomy.org/bibtex/280e27d256f0aa0bc287c8b6c85abc24c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.06.002}, interhash = {80ae09d53de18ebbfd70ef2d6a1a9c22}, intrahash = {80e27d256f0aa0bc287c8b6c85abc24c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 11, pages = {2423-2431}, timestamp = {2020-02-25T13:30:02.000+0100}, title = {A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#SundaramoorthyB14}, volume = 54, year = 2014 }