%0 Conference Paper %1 conf/socc/WonS16 %A Won, Hyosig %A Shimazu, Katsuhiro %B SoCC %D 2016 %E Bhatia, Karan S. %E Alioto, Massimo %E Zhao, Danella %E Marshall, Andrew %E Sridhar, Ramalingam %I IEEE %K dblp %P 35-40 %T Statistical design attribute identification for FinFET outlier and Silicon-to-SPICE gap. %U http://dblp.uni-trier.de/db/conf/socc/socc2016.html#WonS16 %@ 978-1-5090-1367-8

@inproceedings{conf/socc/WonS16, added-at = {2017-04-26T00:00:00.000+0200}, author = {Won, Hyosig and Shimazu, Katsuhiro}, biburl = {https://www.bibsonomy.org/bibtex/29582af77abab2d184259771dc3b2e18f/dblp}, booktitle = {SoCC}, crossref = {conf/socc/2016}, editor = {Bhatia, Karan S. and Alioto, Massimo and Zhao, Danella and Marshall, Andrew and Sridhar, Ramalingam}, ee = {http://dx.doi.org/10.1109/SOCC.2016.7905430}, interhash = {8440999bad0acacb36a2253f83436f7f}, intrahash = {9582af77abab2d184259771dc3b2e18f}, isbn = {978-1-5090-1367-8}, keywords = {dblp}, pages = {35-40}, publisher = {IEEE}, timestamp = {2017-04-27T11:36:35.000+0200}, title = {Statistical design attribute identification for FinFET outlier and Silicon-to-SPICE gap.}, url = {http://dblp.uni-trier.de/db/conf/socc/socc2016.html#WonS16}, year = 2016 }