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%0 Conference Paper
%1 conf/itc/QuerbachKBZAESD14
%A Querbach, Bruce
%A Khanna, Rahul
%A Blankenbeckler, David
%A Zhang, Yulan
%A Anderson, Ronald T.
%A Ellis, David G.
%A Schoenborn, Zale T.
%A Deyati, Sabyasachi
%A Chiang, Patrick
%B ITC
%D 2014
%I IEEE Computer Society
%K
%P 1-10
%T A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time.
%U http://dblp.uni-trier.de/db/conf/itc/itc2014.html#QuerbachKBZAESD14
%@ 978-1-4799-4722-5
@inproceedings{conf/itc/QuerbachKBZAESD14,
added-at = {2023-12-13T02:51:58.000+0100},
author = {Querbach, Bruce and Khanna, Rahul and Blankenbeckler, David and Zhang, Yulan and Anderson, Ronald T. and Ellis, David G. and Schoenborn, Zale T. and Deyati, Sabyasachi and Chiang, Patrick},
biburl = {https://www.bibsonomy.org/bibtex/2dd95a30115964a5c2ae7da1ccd279470/admin},
booktitle = {ITC},
crossref = {conf/itc/2014},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035340},
interhash = {84970fd6ad2dd1399b5a0cec042e776f},
intrahash = {dd95a30115964a5c2ae7da1ccd279470},
isbn = {978-1-4799-4722-5},
keywords = {},
pages = {1-10},
publisher = {IEEE Computer Society},
timestamp = {2023-12-13T02:51:58.000+0100},
title = {A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#QuerbachKBZAESD14},
year = 2014
}