%0 Journal Article %1 journals/technometrics/BaronLC01 %A Baron, Michael I. %A Lakshminarayan, Choudur K. %A Chen, Zhenwu %D 2001 %J Technometrics %K dblp %N 1 %P 66-72 %T Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing. %U http://dblp.uni-trier.de/db/journals/technometrics/technometrics43.html#BaronLC01 %V 43

@article{journals/technometrics/BaronLC01, added-at = {2016-08-24T00:00:00.000+0200}, author = {Baron, Michael I. and Lakshminarayan, Choudur K. and Chen, Zhenwu}, biburl = {https://www.bibsonomy.org/bibtex/283bd67119489d3658fafd1b2dd89344b/dblp}, ee = {http://dx.doi.org/10.1198/00401700152404336}, interhash = {858ba0b35eb8c40c331c822e657cad0b}, intrahash = {83bd67119489d3658fafd1b2dd89344b}, journal = {Technometrics}, keywords = {dblp}, number = 1, pages = {66-72}, timestamp = {2016-08-25T11:33:29.000+0200}, title = {Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing.}, url = {http://dblp.uni-trier.de/db/journals/technometrics/technometrics43.html#BaronLC01}, volume = 43, year = 2001 }