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%0 Conference Paper
%1 conf/itc/NelsonDM01
%A Nelson, Eric A.
%A Dreibelbis, Jeffrey H.
%A McConnell, Roderick
%B ITC
%D 2001
%I IEEE Computer Society
%K dblp
%P 173-181
%T Test and repair of large embedded DRAMs. 2.
%U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#NelsonDM01
%@ 0-7803-7169-0
@inproceedings{conf/itc/NelsonDM01,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Nelson, Eric A. and Dreibelbis, Jeffrey H. and McConnell, Roderick},
biburl = {https://www.bibsonomy.org/bibtex/231e4f59acb996c26cd7c4745f6ded3f2/dblp},
booktitle = {ITC},
crossref = {conf/itc/2001},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966631},
interhash = {8be726066e84fcba0564b1c5fc2e2dff},
intrahash = {31e4f59acb996c26cd7c4745f6ded3f2},
isbn = {0-7803-7169-0},
keywords = {dblp},
pages = {173-181},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:28:56.000+0200},
title = {Test and repair of large embedded DRAMs. 2.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#NelsonDM01},
year = 2001
}