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%0 Journal Article
%1 journals/mr/JiCJK04
%A Ji, M. H.
%A Choi, C.-H.
%A Jang, B. K.
%A Kim, B. K.
%D 2004
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1565-1569
%T Study on electrostatic discharge (ESD) reliability improvement of ZnO-based multilayered chip varistor(MLV).
%U http://dblp.uni-trier.de/db/journals/mr/mr44.html#JiCJK04
%V 44
@article{journals/mr/JiCJK04,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Ji, M. H. and Choi, C.-H. and Jang, B. K. and Kim, B. K.},
biburl = {https://www.bibsonomy.org/bibtex/279927620a0b82f460e85076dfed9f330/dblp},
ee = {https://doi.org/10.1016/j.microrel.2004.07.062},
interhash = {8eb61615c30d4013bca8554604608d15},
intrahash = {79927620a0b82f460e85076dfed9f330},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1565-1569},
timestamp = {2020-02-25T13:25:37.000+0100},
title = {Study on electrostatic discharge (ESD) reliability improvement of ZnO-based multilayered chip varistor(MLV).},
url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#JiCJK04},
volume = 44,
year = 2004
}
