%0 Journal Article %1 journals/mr/AuerspergCDVW16 %A Auersperg, Jürgen %A Collet, Christian %A Dean, Thierry %A Vogel, Dietmar %A Winkler, Thomas %D 2016 %J Microelectron. Reliab. %K dblp %P 665-668 %T Effects of residual stresses on cracking and delamination risks of an avionics MEMS pressure sensor. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#AuerspergCDVW16 %V 64

@article{journals/mr/AuerspergCDVW16, added-at = {2022-03-23T00:00:00.000+0100}, author = {Auersperg, Jürgen and Collet, Christian and Dean, Thierry and Vogel, Dietmar and Winkler, Thomas}, biburl = {https://www.bibsonomy.org/bibtex/29e67f25f9339e6906117a70867ac7906/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.084}, interhash = {8f7124429d688ef292a4938d861e672a}, intrahash = {9e67f25f9339e6906117a70867ac7906}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {665-668}, timestamp = {2024-04-09T02:50:51.000+0200}, title = {Effects of residual stresses on cracking and delamination risks of an avionics MEMS pressure sensor.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#AuerspergCDVW16}, volume = 64, year = 2016 }