%0 Journal Article %1 journals/qre/GonzalezROGQ23 %A González, Luis Carlos Méndez %A Rodríguez-Picón, Luis Alberto %A Olguín, Iván Juan Carlos Pérez %A García, Vicente %A Quezada-Carreón, Abel Eduardo %D 2023 %J Qual. Reliab. Eng. Int. %K dblp %N 3 %P 776-795 %T A reliability analysis for electronic devices under an extension of exponentiated perks distribution. %U http://dblp.uni-trier.de/db/journals/qre/qre39.html#GonzalezROGQ23 %V 39

@article{journals/qre/GonzalezROGQ23, added-at = {2023-04-16T00:00:00.000+0200}, author = {González, Luis Carlos Méndez and Rodríguez-Picón, Luis Alberto and Olguín, Iván Juan Carlos Pérez and García, Vicente and Quezada-Carreón, Abel Eduardo}, biburl = {https://www.bibsonomy.org/bibtex/20998384075b92cf70ac39c60b328f91b/dblp}, ee = {https://doi.org/10.1002/qre.3255}, interhash = {90a2dffc65efd01c47e19ff489647670}, intrahash = {0998384075b92cf70ac39c60b328f91b}, journal = {Qual. Reliab. Eng. Int.}, keywords = {dblp}, month = {April}, number = 3, pages = {776-795}, timestamp = {2024-04-08T14:45:01.000+0200}, title = {A reliability analysis for electronic devices under an extension of exponentiated perks distribution.}, url = {http://dblp.uni-trier.de/db/journals/qre/qre39.html#GonzalezROGQ23}, volume = 39, year = 2023 }