Inproceedings,
In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs.
D. Jeon, T. Baldauf, S. Park, S. Pregl, L. Baraban, G. Cuniberti, T. Mikolajick, and W. Weber.ESSDERC, page 304-307. IEEE, (2017)
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- conf/essderc/JeonBPPBCMW17
- entry type
- inproceedings
- booktitle
- ESSDERC
- year
- 2017
- pages
- 304-307
- publisher
- IEEE
- crossref
- conf/essderc/2017
- ee
- https://doi.org/10.1109/ESSDERC.2017.8066652
- isbn
- 978-1-5090-5978-2
- url
- http://dblp.uni-trier.de/db/conf/essderc/essderc2017.html#JeonBPPBCMW17
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%1 conf/essderc/JeonBPPBCMW17
%A Jeon, Dae-Young
%A Baldauf, Tim
%A Park, So Jeong
%A Pregl, Sebastian
%A Baraban, Larysa
%A Cuniberti, Gianaurelio
%A Mikolajick, Thomas
%A Weber, Walter M.
%B ESSDERC
%D 2017
%I IEEE
%K dblp
%P 304-307
%T In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs.
%U http://dblp.uni-trier.de/db/conf/essderc/essderc2017.html#JeonBPPBCMW17
%@ 978-1-5090-5978-2
@inproceedings{conf/essderc/JeonBPPBCMW17,
added-at = {2023-09-30T00:00:00.000+0200},
author = {Jeon, Dae-Young and Baldauf, Tim and Park, So Jeong and Pregl, Sebastian and Baraban, Larysa and Cuniberti, Gianaurelio and Mikolajick, Thomas and Weber, Walter M.},
biburl = {https://www.bibsonomy.org/bibtex/2f9cefcd688f342e9060487e8ddf2e098/dblp},
booktitle = {ESSDERC},
crossref = {conf/essderc/2017},
ee = {https://doi.org/10.1109/ESSDERC.2017.8066652},
interhash = {91816228deecd50dc0d181df17d3135c},
intrahash = {f9cefcd688f342e9060487e8ddf2e098},
isbn = {978-1-5090-5978-2},
keywords = {dblp},
pages = {304-307},
publisher = {IEEE},
timestamp = {2024-04-10T10:01:43.000+0200},
title = {In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs.},
url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2017.html#JeonBPPBCMW17},
year = 2017
}