%0 Journal Article %1 journals/dt/TreuerA93 %A Treuer, Robert P. %A Agarwal, Vinod K. %D 1993 %J IEEE Des. Test Comput. %K dblp %N 2 %P 24-33 %T Built-In Self-Diagnosis for Repairable Embedded RAMs. %U http://dblp.uni-trier.de/db/journals/dt/dt10.html#TreuerA93 %V 10

@article{journals/dt/TreuerA93, added-at = {2020-05-17T00:00:00.000+0200}, author = {Treuer, Robert P. and Agarwal, Vinod K.}, biburl = {https://www.bibsonomy.org/bibtex/20e8f2d884ee50552992c474b6aece5ff/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/54.211525}, interhash = {92b3a52715a90c0db854783b8fa8a73c}, intrahash = {0e8f2d884ee50552992c474b6aece5ff}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 2, pages = {24-33}, timestamp = {2020-05-19T12:21:25.000+0200}, title = {Built-In Self-Diagnosis for Repairable Embedded RAMs.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt10.html#TreuerA93}, volume = 10, year = 1993 }