Inproceedings,
Test Generation for Open Defects in CMOS Circuits.
N. Devta-Prasanna, A. Gunda, P. Krishnamurthy, S. Reddy, and I. Pomeranz.DFT, page 41-49. IEEE Computer Society, (2006)
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- conf/dft/DevtaprasannaGKRP06
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- inproceedings
- booktitle
- DFT
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- 2006
- pages
- 41-49
- publisher
- IEEE Computer Society
- crossref
- conf/dft/2006
- ee
- https://doi.ieeecomputersociety.org/10.1109/DFT.2006.62
- isbn
- 0-7695-2706-X
- url
- http://dblp.uni-trier.de/db/conf/dft/dft2006.html#DevtaprasannaGKRP06
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- please select -%0 Conference Paper
%1 conf/dft/DevtaprasannaGKRP06
%A Devta-Prasanna, Narendra
%A Gunda, Arun
%A Krishnamurthy, P.
%A Reddy, Sudhakar M.
%A Pomeranz, Irith
%B DFT
%D 2006
%I IEEE Computer Society
%K dblp
%P 41-49
%T Test Generation for Open Defects in CMOS Circuits.
%U http://dblp.uni-trier.de/db/conf/dft/dft2006.html#DevtaprasannaGKRP06
%@ 0-7695-2706-X
@inproceedings{conf/dft/DevtaprasannaGKRP06,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Devta-Prasanna, Narendra and Gunda, Arun and Krishnamurthy, P. and Reddy, Sudhakar M. and Pomeranz, Irith},
biburl = {https://www.bibsonomy.org/bibtex/2d88c3be69f05059797f56d390bf97646/dblp},
booktitle = {DFT},
crossref = {conf/dft/2006},
ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2006.62},
interhash = {931ece78bd9b95626b369189e6067900},
intrahash = {d88c3be69f05059797f56d390bf97646},
isbn = {0-7695-2706-X},
keywords = {dblp},
pages = {41-49},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T12:56:55.000+0200},
title = {Test Generation for Open Defects in CMOS Circuits.},
url = {http://dblp.uni-trier.de/db/conf/dft/dft2006.html#DevtaprasannaGKRP06},
year = 2006
}