%0 Conference Paper %1 conf/date/CornoPRR97 %A Corno, Fulvio %A Prinetto, Paolo %A Rebaudengo, Maurizio %A Reorda, Matteo Sonza %B ED&TC %D 1997 %I IEEE Computer Society %K dblp %P 37-43 %T New static compaction techniques of test sequences for sequential circuits. %U http://dblp.uni-trier.de/db/conf/date/edtc1997.html#CornoPRR97 %@ 0-8186-7786-4

@inproceedings{conf/date/CornoPRR97, added-at = {2022-05-20T00:00:00.000+0200}, author = {Corno, Fulvio and Prinetto, Paolo and Rebaudengo, Maurizio and Reorda, Matteo Sonza}, biburl = {https://www.bibsonomy.org/bibtex/24922783a3e304704c33ccf9f1e33b94a/dblp}, booktitle = {ED&TC}, crossref = {conf/date/1997}, ee = {https://dl.acm.org/doi/10.5555/787260.787764}, interhash = {93a415abe354e9f35f311815818fc5b8}, intrahash = {4922783a3e304704c33ccf9f1e33b94a}, isbn = {0-8186-7786-4}, keywords = {dblp}, pages = {37-43}, publisher = {IEEE Computer Society}, timestamp = {2024-04-09T12:36:28.000+0200}, title = {New static compaction techniques of test sequences for sequential circuits.}, url = {http://dblp.uni-trier.de/db/conf/date/edtc1997.html#CornoPRR97}, year = 1997 }