%0 Conference Paper %1 conf/ats/PomeranzR99a %A Pomeranz, Irith %A Reddy, Sudhakar M. %B Asian Test Symposium %D 1999 %I IEEE Computer Society %K dblp %P 75-80 %T Pattern Sensitivity: A Property to Guide Test Generation for Combinational Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1999.html#PomeranzR99a %@ 0-7695-0315-2

@inproceedings{conf/ats/PomeranzR99a, added-at = {2023-03-24T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/22f9dfb4d96314d3d33837ce30970395d/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1999.810732}, interhash = {96b46bb56abcd83305e99dda407fab3d}, intrahash = {2f9dfb4d96314d3d33837ce30970395d}, isbn = {0-7695-0315-2}, keywords = {dblp}, pages = {75-80}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:07.000+0200}, title = {Pattern Sensitivity: A Property to Guide Test Generation for Combinational Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1999.html#PomeranzR99a}, year = 1999 }