%0 Conference Paper %1 conf/vts/WelchMKJ91 %A Welch, Kyle G. %A Monzel, James A. %A Kent, Donald S. %A Joseph, Donald W. %B VTS %D 1991 %I IEEE Computer Society %K dblp %P 254-259 %T Delay testing and failure analysis of ECL logic with embedded memories. %U http://dblp.uni-trier.de/db/conf/vts/vts1991.html#WelchMKJ91

@inproceedings{conf/vts/WelchMKJ91, added-at = {2023-03-24T00:00:00.000+0100}, author = {Welch, Kyle G. and Monzel, James A. and Kent, Donald S. and Joseph, Donald W.}, biburl = {https://www.bibsonomy.org/bibtex/278a45fe862851d2a7cedb19e6569119a/dblp}, booktitle = {VTS}, crossref = {conf/vts/1991}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1991.208167}, interhash = {97b6521ade4c87f496d489d0bbb4dbca}, intrahash = {78a45fe862851d2a7cedb19e6569119a}, keywords = {dblp}, pages = {254-259}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:10.000+0200}, title = {Delay testing and failure analysis of ECL logic with embedded memories.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1991.html#WelchMKJ91}, year = 1991 }