%0 Journal Article %1 journals/tcad/Pomeranz14e %A Pomeranz, Irith %D 2014 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 12 %P 1955-1964 %T Static Test Compaction for Scan Circuits by Using Restoration to Modify and Remove Tests. %U http://dblp.uni-trier.de/db/journals/tcad/tcad33.html#Pomeranz14e %V 33

@article{journals/tcad/Pomeranz14e, added-at = {2022-08-16T00:00:00.000+0200}, author = {Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/24c3051b538df496a58cddb2da45a88d1/dblp}, ee = {https://www.wikidata.org/entity/Q113089016}, interhash = {9c3b3c71c7876d1a66b61e5be54e0ed8}, intrahash = {4c3051b538df496a58cddb2da45a88d1}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 12, pages = {1955-1964}, timestamp = {2024-04-08T19:46:00.000+0200}, title = {Static Test Compaction for Scan Circuits by Using Restoration to Modify and Remove Tests.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad33.html#Pomeranz14e}, volume = 33, year = 2014 }