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- BibTeX key
- conf/irps/KimJSKJCPSP18
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2018
- pages
- 4
- publisher
- IEEE
- crossref
- conf/irps/2018
- ee
- https://doi.org/10.1109/IRPS.2018.8353577
- isbn
- 978-1-5386-5479-8
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2018.html#KimJSKJCPSP18
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- please select -%0 Conference Paper
%1 conf/irps/KimJSKJCPSP18
%A Kim, Hyunjin
%A Jin, Minjung
%A Sagong, Hyun-Chul
%A Kim, Jinju
%A Jung, Ukjin
%A Choi, Minhyuck
%A Park, Junekyun
%A Shin, Sangchul
%A Pae, Sangwoo
%B IRPS
%D 2018
%I IEEE
%K dblp
%P 4
%T A systematic study of gate dielectric TDDB in FinFET technology.
%U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#KimJSKJCPSP18
%@ 978-1-5386-5479-8
@inproceedings{conf/irps/KimJSKJCPSP18,
added-at = {2019-01-22T00:00:00.000+0100},
author = {Kim, Hyunjin and Jin, Minjung and Sagong, Hyun-Chul and Kim, Jinju and Jung, Ukjin and Choi, Minhyuck and Park, Junekyun and Shin, Sangchul and Pae, Sangwoo},
biburl = {https://www.bibsonomy.org/bibtex/266091c9b0a3ab031ae3801a3532f3fa6/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2018},
ee = {https://doi.org/10.1109/IRPS.2018.8353577},
interhash = {9cdf6c2e7291872cc4dafe5f24d7ca7b},
intrahash = {66091c9b0a3ab031ae3801a3532f3fa6},
isbn = {978-1-5386-5479-8},
keywords = {dblp},
pages = 4,
publisher = {IEEE},
timestamp = {2019-10-17T14:45:36.000+0200},
title = {A systematic study of gate dielectric TDDB in FinFET technology.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#KimJSKJCPSP18},
year = 2018
}