%0 Conference Paper %1 conf/ets/WanK15 %A Wan, Jinbo %A Kerkhoff, Hans G. %B ETS %D 2015 %I IEEE %K dblp %P 1-6 %T New drain current model for nano-meter MOS transistors on-chip threshold voltage test. %U http://dblp.uni-trier.de/db/conf/ets/ets2015.html#WanK15 %@ 978-1-4799-7603-4

@inproceedings{conf/ets/WanK15, added-at = {2017-05-22T00:00:00.000+0200}, author = {Wan, Jinbo and Kerkhoff, Hans G.}, biburl = {https://www.bibsonomy.org/bibtex/25477f06ae7336ca06b448d72a4ca5fd9/dblp}, booktitle = {ETS}, crossref = {conf/ets/2015}, ee = {https://doi.org/10.1109/ETS.2015.7138751}, interhash = {9eb580cde7c56bd41ca97b86040e841b}, intrahash = {5477f06ae7336ca06b448d72a4ca5fd9}, isbn = {978-1-4799-7603-4}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T15:59:26.000+0200}, title = {New drain current model for nano-meter MOS transistors on-chip threshold voltage test.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2015.html#WanK15}, year = 2015 }