Inproceedings,
Reliability-aware design for nanometer-scale devices.
D. Atienza, G. Micheli, L. Benini, J. Ayala, P. Valle, M. DeBole, and V. Narayanan.ASP-DAC, page 549-554. IEEE, (2008)
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- conf/aspdac/AtienzaMBAVDN08
- entry type
- inproceedings
- booktitle
- ASP-DAC
- year
- 2008
- pages
- 549-554
- publisher
- IEEE
- crossref
- conf/aspdac/2008
- ee
- http://dl.acm.org/citation.cfm?id=1356935
- isbn
- 978-1-4244-1922-7
- url
- http://dblp.uni-trier.de/db/conf/aspdac/aspdac2008.html#AtienzaMBAVDN08
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- please select -%0 Conference Paper
%1 conf/aspdac/AtienzaMBAVDN08
%A Atienza, David
%A Micheli, Giovanni De
%A Benini, Luca
%A Ayala, José L.
%A Valle, Pablo García Del
%A DeBole, Michael
%A Narayanan, Vijaykrishnan
%B ASP-DAC
%D 2008
%E Kyung, Chong-Min
%E Choi, Kiyoung
%E Ha, Soonhoi
%I IEEE
%K dblp
%P 549-554
%T Reliability-aware design for nanometer-scale devices.
%U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2008.html#AtienzaMBAVDN08
%@ 978-1-4244-1922-7
@inproceedings{conf/aspdac/AtienzaMBAVDN08,
added-at = {2016-11-16T00:00:00.000+0100},
author = {Atienza, David and Micheli, Giovanni De and Benini, Luca and Ayala, José L. and Valle, Pablo García Del and DeBole, Michael and Narayanan, Vijaykrishnan},
biburl = {https://www.bibsonomy.org/bibtex/2c2e7cb2d496184bcea4ead7e07388045/dblp},
booktitle = {ASP-DAC},
crossref = {conf/aspdac/2008},
editor = {Kyung, Chong-Min and Choi, Kiyoung and Ha, Soonhoi},
ee = {http://dl.acm.org/citation.cfm?id=1356935},
interhash = {a00df03fd9319a610c09273e465c77ce},
intrahash = {c2e7cb2d496184bcea4ead7e07388045},
isbn = {978-1-4244-1922-7},
keywords = {dblp},
pages = {549-554},
publisher = {IEEE},
timestamp = {2016-11-17T11:45:24.000+0100},
title = {Reliability-aware design for nanometer-scale devices.},
url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2008.html#AtienzaMBAVDN08},
year = 2008
}