%0 Conference Paper %1 conf/irps/UemuraCJJJJRLRP20 %A Uemura, Taiki %A Chung, Byungjin %A Jo, Jeongmin %A Jiang, Hai %A Ji, Yongsung %A Jeong, Tae-Young %A Ranjan, Rakesh %A Lee, Seungbae %A Rhee, Hwasung %A Pae, Sangwoo %A Lee, Euncheol %A Choi, Jaehee %A Ohnishi, Shota %A Machida, Ken %B IRPS %D 2020 %I IEEE %K dblp %P 1-4 %T Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#UemuraCJJJJRLRP20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/UemuraCJJJJRLRP20, added-at = {2020-11-24T00:00:00.000+0100}, author = {Uemura, Taiki and Chung, Byungjin and Jo, Jeongmin and Jiang, Hai and Ji, Yongsung and Jeong, Tae-Young and Ranjan, Rakesh and Lee, Seungbae and Rhee, Hwasung and Pae, Sangwoo and Lee, Euncheol and Choi, Jaehee and Ohnishi, Shota and Machida, Ken}, biburl = {https://www.bibsonomy.org/bibtex/2947aa3f50f77172237af9d86145de4b2/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9129331}, interhash = {a064957193f327d15987b7a4ad78842c}, intrahash = {947aa3f50f77172237af9d86145de4b2}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2020-11-25T11:39:48.000+0100}, title = {Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#UemuraCJJJJRLRP20}, year = 2020 }