%0 Journal Article %1 journals/mr/KarnerGWEHGVGKS07 %A Karner, Markus %A Gehring, Andreas %A Wagner, M. %A Entner, Robert %A Holzer, Stefan %A Gös, Wolfgang %A Vasicek, M. %A Grasser, Tibor %A Kosina, Hans %A Selberherr, Siegfried %D 2007 %J Microelectron. Reliab. %K %N 4-5 %P 704-708 %T VSP - A gate stack analyzer. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#KarnerGWEHGVGKS07 %V 47

@article{journals/mr/KarnerGWEHGVGKS07, added-at = {2023-12-13T05:23:14.000+0100}, author = {Karner, Markus and Gehring, Andreas and Wagner, M. and Entner, Robert and Holzer, Stefan and Gös, Wolfgang and Vasicek, M. and Grasser, Tibor and Kosina, Hans and Selberherr, Siegfried}, biburl = {https://www.bibsonomy.org/bibtex/24e443105ebc1fc7c5bd306ac413069cc/admin}, ee = {https://www.wikidata.org/entity/Q62600303}, interhash = {a1f31ba49b3d88d21541687046d98bdc}, intrahash = {4e443105ebc1fc7c5bd306ac413069cc}, journal = {Microelectron. Reliab.}, keywords = {}, number = {4-5}, pages = {704-708}, timestamp = {2023-12-13T05:23:14.000+0100}, title = {VSP - A gate stack analyzer.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#KarnerGWEHGVGKS07}, volume = 47, year = 2007 }