Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/irps/ContaminCGGVGJV22
%A Contamin, Lauriane
%A Cassé, Mikaël
%A Garros, Xavier
%A Gaillard, Fred
%A Vinet, Maud
%A Galy, Philippe
%A Juge, André
%A Vincent, Emmanuel
%A Franceschi, Silvano De
%A Meunier, Tristan
%B IRPS
%D 2022
%I IEEE
%K dblp
%P 7
%T Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4K.
%U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ContaminCGGVGJV22
%@ 978-1-6654-7950-9
@inproceedings{conf/irps/ContaminCGGVGJV22,
added-at = {2022-05-10T00:00:00.000+0200},
author = {Contamin, Lauriane and Cassé, Mikaël and Garros, Xavier and Gaillard, Fred and Vinet, Maud and Galy, Philippe and Juge, André and Vincent, Emmanuel and Franceschi, Silvano De and Meunier, Tristan},
biburl = {https://www.bibsonomy.org/bibtex/2e2e1f4f3dfff2b859dcfe4f1efcde9f0/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2022},
ee = {https://doi.org/10.1109/IRPS48227.2022.9764571},
interhash = {a37bd423ff0057585f8a4999418655e8},
intrahash = {e2e1f4f3dfff2b859dcfe4f1efcde9f0},
isbn = {978-1-6654-7950-9},
keywords = {dblp},
pages = 7,
publisher = {IEEE},
timestamp = {2024-04-09T12:18:58.000+0200},
title = {Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4K.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ContaminCGGVGJV22},
year = 2022
}