Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/esscirc/PatelRYLCKYHE16
%A Patel, Harsh N.
%A Roy, Abhishek
%A Yahya, Farah B.
%A Liu, Ningxi
%A Calhoun, Benton H.
%A Kumeno, Kazuyuki
%A Yasuda, Makoto
%A Harada, Akihiko
%A Ema, Taiji
%B ESSCIRC
%D 2016
%I IEEE
%K dblp
%P 45-48
%T A 55nm Ultra Low Leakage Deeply Depleted Channel technology optimized for energy minimization in subthreshold SRAM and logic.
%U http://dblp.uni-trier.de/db/conf/esscirc/esscirc2016.html#PatelRYLCKYHE16
%@ 978-1-5090-2972-3
@inproceedings{conf/esscirc/PatelRYLCKYHE16,
added-at = {2019-09-25T00:00:00.000+0200},
author = {Patel, Harsh N. and Roy, Abhishek and Yahya, Farah B. and Liu, Ningxi and Calhoun, Benton H. and Kumeno, Kazuyuki and Yasuda, Makoto and Harada, Akihiko and Ema, Taiji},
biburl = {https://www.bibsonomy.org/bibtex/2ac5a968eadd333f94a9f436290b7ce79/dblp},
booktitle = {ESSCIRC},
crossref = {conf/esscirc/2016},
ee = {https://doi.org/10.1109/ESSCIRC.2016.7598239},
interhash = {a41431ad20bbf942c948d988ae21af23},
intrahash = {ac5a968eadd333f94a9f436290b7ce79},
isbn = {978-1-5090-2972-3},
keywords = {dblp},
pages = {45-48},
publisher = {IEEE},
timestamp = {2019-10-17T20:57:15.000+0200},
title = {A 55nm Ultra Low Leakage Deeply Depleted Channel technology optimized for energy minimization in subthreshold SRAM and logic.},
url = {http://dblp.uni-trier.de/db/conf/esscirc/esscirc2016.html#PatelRYLCKYHE16},
year = 2016
}