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%0 Conference Paper
%1 conf/dtis/WillschHHDKV18
%A Willsch, Benjamin
%A te Heesen, Marius
%A Hauser, Julia
%A Dreiner, Stefan
%A Kappert, Holger
%A Vogt, Holger
%B DTIS
%D 2018
%I IEEE
%K
%P 1-6
%T Evaluation of a median threshold based EEPROM-PUF concept implemented in a high temperature SOI CMOS technology.
%U http://dblp.uni-trier.de/db/conf/dtis/dtis2018.html#WillschHHDKV18
%@ 978-1-5386-5291-6
@inproceedings{conf/dtis/WillschHHDKV18,
added-at = {2023-12-13T05:46:37.000+0100},
author = {Willsch, Benjamin and te Heesen, Marius and Hauser, Julia and Dreiner, Stefan and Kappert, Holger and Vogt, Holger},
biburl = {https://www.bibsonomy.org/bibtex/289d83ca50d2281097177a316b1f0da96/admin},
booktitle = {DTIS},
crossref = {conf/dtis/2018},
ee = {https://doi.org/10.1109/DTIS.2018.8368576},
interhash = {a66fc9cf084a12fa21ce5352f5dd19dc},
intrahash = {89d83ca50d2281097177a316b1f0da96},
isbn = {978-1-5386-5291-6},
keywords = {},
pages = {1-6},
publisher = {IEEE},
timestamp = {2023-12-13T05:46:37.000+0100},
title = {Evaluation of a median threshold based EEPROM-PUF concept implemented in a high temperature SOI CMOS technology.},
url = {http://dblp.uni-trier.de/db/conf/dtis/dtis2018.html#WillschHHDKV18},
year = 2018
}