%0 Conference Paper %1 conf/itc/McConnellRND01 %A McConnell, Roderick %A Rajsuman, Rochit %A Nelson, Eric A. %A Dreibelbis, Jeffrey H. %B ITC %D 2001 %I IEEE Computer Society %K dblp %P 163-172 %T Test and repair of large embedded DRAMs. I. %U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#McConnellRND01 %@ 0-7803-7169-0

@inproceedings{conf/itc/McConnellRND01, added-at = {2023-03-23T00:00:00.000+0100}, author = {McConnell, Roderick and Rajsuman, Rochit and Nelson, Eric A. and Dreibelbis, Jeffrey H.}, biburl = {https://www.bibsonomy.org/bibtex/204e368872093243dbf6a28f71965c2d7/dblp}, booktitle = {ITC}, crossref = {conf/itc/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966630}, interhash = {a989f21966da82cc4d88a3e6aff9039f}, intrahash = {04e368872093243dbf6a28f71965c2d7}, isbn = {0-7803-7169-0}, keywords = {dblp}, pages = {163-172}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:56.000+0200}, title = {Test and repair of large embedded DRAMs. I.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#McConnellRND01}, year = 2001 }