%0 Conference Paper %1 conf/itc/Pomeranz03 %A Pomeranz, Irith %B ITC %D 2003 %I IEEE Computer Society %K dblp %P 441-450 %T Reducing Test Data Volume Using Random-Testable and Periodic-Testable Scan Chains in Circuits with Multiple Scan Chains. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#Pomeranz03 %@ 0-7803-8106-8

@inproceedings{conf/itc/Pomeranz03, added-at = {2023-03-23T00:00:00.000+0100}, author = {Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/24d22ca5b015d9d1689c7acec4be6b88d/dblp}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270869}, interhash = {ac1fa104da1e95653107d336df8ff6c5}, intrahash = {4d22ca5b015d9d1689c7acec4be6b88d}, isbn = {0-7803-8106-8}, keywords = {dblp}, pages = {441-450}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:31.000+0200}, title = {Reducing Test Data Volume Using Random-Testable and Periodic-Testable Scan Chains in Circuits with Multiple Scan Chains.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#Pomeranz03}, year = 2003 }