%0 Conference Paper %1 conf/ieem/LiuYC15 %A Liu, Hanlin %A Yeh, Ruey Huei %A Cai, Baoping %B IEEM %D 2015 %I IEEE %K %P 756-760 %T Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon. %U http://dblp.uni-trier.de/db/conf/ieem/ieem2015.html#LiuYC15 %@ 978-1-4673-8066-9

@inproceedings{conf/ieem/LiuYC15, added-at = {2023-12-13T06:31:49.000+0100}, author = {Liu, Hanlin and Yeh, Ruey Huei and Cai, Baoping}, biburl = {https://www.bibsonomy.org/bibtex/2b4ecb824cd18ee46a87dfca28c0dc585/admin}, booktitle = {IEEM}, crossref = {conf/ieem/2015}, ee = {http://dx.doi.org/10.1109/IEEM.2015.7385749}, interhash = {aeb6605c36fdb2adbce0488244cc0ae3}, intrahash = {b4ecb824cd18ee46a87dfca28c0dc585}, isbn = {978-1-4673-8066-9}, keywords = {}, pages = {756-760}, publisher = {IEEE}, timestamp = {2023-12-13T06:31:49.000+0100}, title = {Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon.}, url = {http://dblp.uni-trier.de/db/conf/ieem/ieem2015.html#LiuYC15}, year = 2015 }