%0 Conference Paper %1 conf/icig/CuiJLPA09 %A Cui, Yue %A Jin, Jesse S. %A Luo, Suhuai %A Park, Mira %A Au, Sherlock S. L. %B ICIG %D 2009 %I IEEE Computer Society %K dblp %P 768-773 %T Automated Pattern Recognition and Defect Inspection System. %U http://dblp.uni-trier.de/db/conf/icig/icig2009.html#CuiJLPA09 %@ 978-0-7695-3883-9

@inproceedings{conf/icig/CuiJLPA09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Cui, Yue and Jin, Jesse S. and Luo, Suhuai and Park, Mira and Au, Sherlock S. L.}, biburl = {https://www.bibsonomy.org/bibtex/2a058a029d9e844a53032ade9b0e94b5c/dblp}, booktitle = {ICIG}, crossref = {conf/icig/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICIG.2009.144}, interhash = {b2a803d36b8f3eeb47705e4b3716a866}, intrahash = {a058a029d9e844a53032ade9b0e94b5c}, isbn = {978-0-7695-3883-9}, keywords = {dblp}, pages = {768-773}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T17:16:17.000+0200}, title = {Automated Pattern Recognition and Defect Inspection System.}, url = {http://dblp.uni-trier.de/db/conf/icig/icig2009.html#CuiJLPA09}, year = 2009 }