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- BibTeX key
- conf/icnc/ZhangLZL18
- entry type
- inproceedings
- booktitle
- ICNC-FSKD
- year
- 2018
- pages
- 276-282
- publisher
- IEEE
- crossref
- conf/icnc/2018
- ee
- https://doi.org/10.1109/FSKD.2018.8686866
- isbn
- 978-1-5386-8097-1
- url
- http://dblp.uni-trier.de/db/conf/icnc/icnc2018.html#ZhangLZL18
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- please select -%0 Conference Paper
%1 conf/icnc/ZhangLZL18
%A Zhang, Chijian
%A Li, Junkai
%A Zhang, Yanxi
%A Liu, Congcong
%B ICNC-FSKD
%D 2018
%E Li, Maozhen
%E Xiong, Ning
%E Xiao, Zheng
%E Xiao, Guoqing
%E Li, Kenli
%E Wang, Libo
%I IEEE
%K dblp
%P 276-282
%T Machine Learning and Knowledge Discovery in Analog Circuit Fault Detection.
%U http://dblp.uni-trier.de/db/conf/icnc/icnc2018.html#ZhangLZL18
%@ 978-1-5386-8097-1
@inproceedings{conf/icnc/ZhangLZL18,
added-at = {2019-04-18T00:00:00.000+0200},
author = {Zhang, Chijian and Li, Junkai and Zhang, Yanxi and Liu, Congcong},
biburl = {https://www.bibsonomy.org/bibtex/281aac4207e13c51497cdafa67fce1baa/dblp},
booktitle = {ICNC-FSKD},
crossref = {conf/icnc/2018},
editor = {Li, Maozhen and Xiong, Ning and Xiao, Zheng and Xiao, Guoqing and Li, Kenli and Wang, Libo},
ee = {https://doi.org/10.1109/FSKD.2018.8686866},
interhash = {b4076900aff6453488e14fa5578cd52e},
intrahash = {81aac4207e13c51497cdafa67fce1baa},
isbn = {978-1-5386-8097-1},
keywords = {dblp},
pages = {276-282},
publisher = {IEEE},
timestamp = {2024-04-09T18:52:57.000+0200},
title = {Machine Learning and Knowledge Discovery in Analog Circuit Fault Detection.},
url = {http://dblp.uni-trier.de/db/conf/icnc/icnc2018.html#ZhangLZL18},
year = 2018
}