%0 Conference Paper %1 conf/vts/SunterCBR14 %A Sunter, Stephen K. %A Comen, Steve %A Berndt, Paul %A Rajamani, Ram %B VTS %D 2014 %I IEEE Computer Society %K dblp %P 1 %T Innovative practices session 7C: Reduced pin-count testing - How low can we go? %U http://dblp.uni-trier.de/db/conf/vts/vts2014.html#SunterCBR14 %@ 978-1-4799-2611-4

@inproceedings{conf/vts/SunterCBR14, added-at = {2023-03-24T00:00:00.000+0100}, author = {Sunter, Stephen K. and Comen, Steve and Berndt, Paul and Rajamani, Ram}, biburl = {https://www.bibsonomy.org/bibtex/2694baf4fbacead6291cf2809abbec2d0/dblp}, booktitle = {VTS}, crossref = {conf/vts/2014}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.2014.6818778}, interhash = {b5b281413b4c3a7bf4b1c4b498db66f0}, intrahash = {694baf4fbacead6291cf2809abbec2d0}, isbn = {978-1-4799-2611-4}, keywords = {dblp}, pages = 1, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:41:59.000+0200}, title = {Innovative practices session 7C: Reduced pin-count testing - How low can we go?}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2014.html#SunterCBR14}, year = 2014 }