%0 Conference Paper %1 conf/vts/PolianB01 %A Polian, Ilia %A Becker, Bernd %B VTS %D 2001 %I IEEE Computer Society %K %P 88-93 %T Multiple Scan Chain Design for Two-Pattern Testing. %U http://dblp.uni-trier.de/db/conf/vts/vts2001.html#PolianB01 %@ 0-7695-1122-8

@inproceedings{conf/vts/PolianB01, added-at = {2023-12-13T07:13:18.000+0100}, author = {Polian, Ilia and Becker, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/28295f411e122d486d71dc7390f3f4b14/admin}, booktitle = {VTS}, crossref = {conf/vts/2001}, ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923423}, interhash = {b681d48c42c8e92078469940091dfdf5}, intrahash = {8295f411e122d486d71dc7390f3f4b14}, isbn = {0-7695-1122-8}, keywords = {}, pages = {88-93}, publisher = {IEEE Computer Society}, timestamp = {2023-12-13T07:13:18.000+0100}, title = {Multiple Scan Chain Design for Two-Pattern Testing.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2001.html#PolianB01}, year = 2001 }