%0 Journal Article %1 journals/mr/RajiPG15 %A Raji, Mohsen %A Pedram, Hossein %A Ghavami, Behnam %D 2015 %J Microelectron. Reliab. %K dblp %N 2 %P 448-460 %T A practical metric for soft error vulnerability analysis of combinational circuits. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#RajiPG15 %V 55

@article{journals/mr/RajiPG15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Raji, Mohsen and Pedram, Hossein and Ghavami, Behnam}, biburl = {https://www.bibsonomy.org/bibtex/200a1f9cef658b513fa29bfedbbe963a8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.11.004}, interhash = {b684d8461e6d28a081d75425e0a20258}, intrahash = {00a1f9cef658b513fa29bfedbbe963a8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {448-460}, timestamp = {2020-02-25T13:29:02.000+0100}, title = {A practical metric for soft error vulnerability analysis of combinational circuits.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#RajiPG15}, volume = 55, year = 2015 }